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Built-In Self-Test
Last modified: Tuesday, February 07, 2006 

Built-In Self-Test is a function of an integrated circuit that can verify all or some of its internal functionality.
  Related Links

Online Built-In Self-Test For Operational Faults (PDF)
A practical on-line periodic BIST method for the detection of operational faults in digital systems.

Related Categories
Integrated Circuits (ICs)

Microprocessors

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ASIC

chip

flip-flop

function

I2C

integrated circuit

nanotechnology

routine

silicon

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